Title :
A third-order sigma-delta modulator with extended dynamic range
Author :
Williams, Louis A., III ; Wooley, Bruce A.
Author_Institution :
Center for Integrated Syst., Stanford Univ., CA, USA
fDate :
3/1/1994 12:00:00 AM
Abstract :
Oversampling modulators based on high-order sigma-delta modulation provide an effective means of achieving high-resolution analog-to-digital conversion in VLSI technology. Because high-order noise shaping greatly reduces the quantization noise in the signal band, the dynamic range of these modulators tends to be bounded by the thermal noise of the input stage and the maximum voltage swing in the signal path. This paper introduces a third-order cascaded sigma-delta modulator that uses a modified cascaded architecture and reduced gain in the first integrator to increase the dynamic range. An experimental modulator fabricated in a 1-μm CMOS technology attains a resolution of 17 b for a 25-kHz signal bandwidth while operating from a single 5-V supply. With an oversampling ratio of 128 and a clock frequency of 6.4 MHz, the modulator achieves a 104-dB dynamic range and a peak signal-to-noise+distortion ratio (SNDR) of 98 dB. As indicated by both measurements and simulations, the cascaded architecture also greatly reduces the discrete noise peaks that can be present in a single-stage architecture
Keywords :
CMOS integrated circuits; VLSI; analogue-digital conversion; application specific integrated circuits; cascade networks; delta modulation; modulators; thermal noise; 1 micron; 25 kHz; 6.4 MHz; 98 dB; ASIC; CMOS technology; SNDR; VLSI technology; analog-to-digital conversion; dynamic range; high-order noise shaping; high-order sigma-delta modulation; high-resolution ADC; integrator; maximum voltage swing; modified cascaded architecture; oversampling modulators; quantization noise; sigma-delta modulator; single 5-V supply; thermal noise; third-order type; Analog-digital conversion; CMOS technology; Delta-sigma modulation; Dynamic range; Noise reduction; Noise shaping; Quantization; Signal resolution; Very large scale integration; Voltage;
Journal_Title :
Solid-State Circuits, IEEE Journal of