DocumentCode
1058237
Title
IVa-7 the effects of charge injection on gated-diode breakdown
Author
Amantea, R. ; Muller, R.S.
Volume
24
Issue
9
fYear
1977
fDate
9/1/1977 12:00:00 AM
Firstpage
1208
Lastpage
1208
Keywords
Breakdown voltage; Electric breakdown; Hot carriers; Impact ionization; Impurities; Insulation; Laboratories; Semiconductor diodes; Split gate flash memory cells; Substrates;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1977.18954
Filename
1479146
Link To Document