• DocumentCode
    1058247
  • Title

    IVa-6 studies of Si/SiO2interfaces by Auger sputter profiling and photoelectron spectroscopy using synchrotron radiation

  • Author

    Garner, C.M. ; Miller, Jason ; Lindau, I. ; Schwarz, Stefan ; Spicer, W.E.

  • Volume
    24
  • Issue
    9
  • fYear
    1977
  • fDate
    9/1/1977 12:00:00 AM
  • Firstpage
    1208
  • Lastpage
    1208
  • Keywords
    Application specific processors; Breakdown voltage; Chemical technology; Contracts; Diodes; Electric breakdown; Insulation; Laboratories; Silicon; Spectroscopy;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1977.18955
  • Filename
    1479147
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1058247