DocumentCode
1058383
Title
V-5 an analysis of the effects of interface recombination on the transient response of double heterojunction devices
Author
Armiento, C.A. ; Fonstad, C.G.
Volume
24
Issue
9
fYear
1977
fDate
9/1/1977 12:00:00 AM
Firstpage
1213
Lastpage
1213
Keywords
Charge carrier lifetime; Diode lasers; Heterojunctions; Indium phosphide; Laboratories; Laser modes; Light emitting diodes; Materials science and technology; Photodiodes; Transient response;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1977.18967
Filename
1479159
Link To Document