• DocumentCode
    1058391
  • Title

    Design and Analysis for a 60-GHz Low-Noise Amplifier With RF ESD Protection

  • Author

    Huang, Bo-Jr ; Wang, Chi-Hsueh ; Chen, Chung-Chun ; Lei, Ming-Fong ; Huang, Pin-Cheng ; Lin, Kun-You ; Wang, Huei

  • Author_Institution
    Dept. of Electr. Eng. & Grad., Nat. Taiwan Univ., Taipei
  • Volume
    57
  • Issue
    2
  • fYear
    2009
  • Firstpage
    298
  • Lastpage
    305
  • Abstract
    An RF electrostatic discharge (ESD) protection for millimeter-wave (MMW) regime applied to a 60-GHz low-noise amplifier (LNA) in mixed-signal and RF purpose 0.13-mum CMOS technology is demonstrated in this paper. The measured results show that this chip achieves a small signal gain of 20.4 dB and a noise figure (NF) of 8.7 dB at 60 GHz with 65-mW dc power consumption. Without ESD protection, the LNA exhibits a gain of 20.2 dB and an NF of 7.2 dB at 60 GHz. This ESD protection using an impedance isolation method to minimize the RF performance degradation sustains 6.5-kV voltage level of the human body model on the diode and 1.5 kV on the core circuit, which is much higher than that without ESD protection (< 350 V). To our knowledge, this is the first CMOS LNA with RF ESD protection in the MMW regime and has the highest operation frequency reported to date.
  • Keywords
    CMOS integrated circuits; diodes; electrostatic discharge; low noise amplifiers; millimetre wave amplifiers; CMOS technology; RF ESD protection; RF performance degradation; core circuit; diode; electrostatic discharge; frequency 60 GHz; human body model; impedance isolation method; low-noise amplifier; millimeter-wave process; noise figure 7.2 dB; noise figure 8.7 dB; power 65 mW; size 0.13 mum; voltage 1.5 kV; voltage 6.5 kV; CMOS integrated circuits (ICs); RF electrostatic discharge (ESD) protection; low-noise amplifiers (LNAs); millimeter-wave (MMW) circuits;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/TMTT.2008.2011158
  • Filename
    4738429