Title :
VI-2 a new spectroscopic technique for imaging the spatial distribution of non-radiative defects
Author :
Petroff, Pierre M. ; Lang, D.V.
fDate :
9/1/1977 12:00:00 AM
Keywords :
Annealing; Epitaxial layers; Gallium arsenide; P-n junctions; Photoluminescence; Scanning electron microscopy; Spatial resolution; Spectroscopy; Transient analysis; Transmission electron microscopy;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1977.18975
