DocumentCode
1058509
Title
VI-8 contactless measurement of minority carrier lifetime in silicon
Author
White, J.C. ; Unter, T.F. ; Smith, J.G.
Volume
24
Issue
9
fYear
1977
fDate
9/1/1977 12:00:00 AM
Firstpage
1217
Lastpage
1218
Keywords
Charge carrier lifetime; Infrared detectors; Optical surface waves; Radiation detectors; Radiative recombination; Silicon; Spatial resolution; Spontaneous emission; Surface emitting lasers; Time measurement;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1977.18980
Filename
1479172
Link To Document