DocumentCode :
1058545
Title :
Characteristics of I2L at low current levels
Author :
Mattheus, Walter H. ; Mertens, Robert P. ; Stulting, Jan D.
Author_Institution :
Katholieke Universitiet Leuven, Heverlee, Belgium
Volume :
24
Issue :
10
fYear :
1977
fDate :
10/1/1977 12:00:00 AM
Firstpage :
1228
Lastpage :
1233
Abstract :
The validity of the injection model is assessed in the low power range. Experimental evidence is given that the three base current components ( 
, and Ip ) can be determined from a three-gate experiment. The results are explained from the underlying device physics. Experimental data are presented for the temperature dependence of the upward current gain.
, and IKeywords :
Batteries; Current measurement; Electrons; Logic devices; Physics; Temperature dependence; Temperature distribution; Testing; Voltage; Watches;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1977.18984
Filename :
1479176
Link To Document :
