• DocumentCode
    1058545
  • Title

    Characteristics of I2L at low current levels

  • Author

    Mattheus, Walter H. ; Mertens, Robert P. ; Stulting, Jan D.

  • Author_Institution
    Katholieke Universitiet Leuven, Heverlee, Belgium
  • Volume
    24
  • Issue
    10
  • fYear
    1977
  • fDate
    10/1/1977 12:00:00 AM
  • Firstpage
    1228
  • Lastpage
    1233
  • Abstract
    The validity of the injection model is assessed in the low power range. Experimental evidence is given that the three base current components ( I_{nc}, I_{no} , and Ip) can be determined from a three-gate experiment. The results are explained from the underlying device physics. Experimental data are presented for the temperature dependence of the upward current gain.
  • Keywords
    Batteries; Current measurement; Electrons; Logic devices; Physics; Temperature dependence; Temperature distribution; Testing; Voltage; Watches;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1977.18984
  • Filename
    1479176
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1058545