DocumentCode
1058617
Title
An analysis of space-charge-region recombination in HBT´s
Author
Searles, Shawn ; Pulfrey, David L.
Author_Institution
Dept. of Electr. Eng., British Columbia Univ., Vancouver, BC, Canada
Volume
41
Issue
4
fYear
1994
fDate
4/1/1994 12:00:00 AM
Firstpage
476
Lastpage
483
Abstract
The importance of including recombination in the base side of the emitter-base space-charge-region (SCR) in the computation of the current gain in AlGaAs/GaAs HBT´s is investigated. Recombination due to Shockley-Read-Hall, Auger and radiative processes is considered. The interaction of the base-side SCR recombination currents with the neutral-base current and the collector current, which occurs via their dependence on the quasi-Fermi level splitting (ΔEfn) at the base-emitter junction, is not found to be a significant factor in the computation of ΔEfn. However, it is confirmed that the quasi-Fermi level splitting, as calculated from a balancing of the thermionic/tunnel current with the neutral base and collector currents, must subsequently be included in the computation of the base-side SCR currents if the current gain is not to be severely underestimated. A discussion of why the ideality factor is ≈1 for the base-side SCR currents is given. Finally, simple analytical expressions for ΔE fn and the SCR recombination currents are presented and should prove useful for HBT device- and circuit-simulation purposes
Keywords
Auger effect; III-V semiconductors; aluminium compounds; electron-hole recombination; gallium arsenide; heterojunction bipolar transistors; semiconductor device models; space charge; tunnelling; AlGaAs-GaAs; Auger processes; HBT; Shockley-Read-Hall processes; collector current; current gain; emitter-base space-charge-region; ideality factor; neutral-base current; quasi-Fermi level splitting; radiative processes; space-charge-region recombination; thermionic/tunnel current balancing; Circuits; Councils; Electron emission; Equations; Helium; Heterojunction bipolar transistors; Physics computing; Spontaneous emission; Telecommunications; Thyristors;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/16.278498
Filename
278498
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