• DocumentCode
    1058617
  • Title

    An analysis of space-charge-region recombination in HBT´s

  • Author

    Searles, Shawn ; Pulfrey, David L.

  • Author_Institution
    Dept. of Electr. Eng., British Columbia Univ., Vancouver, BC, Canada
  • Volume
    41
  • Issue
    4
  • fYear
    1994
  • fDate
    4/1/1994 12:00:00 AM
  • Firstpage
    476
  • Lastpage
    483
  • Abstract
    The importance of including recombination in the base side of the emitter-base space-charge-region (SCR) in the computation of the current gain in AlGaAs/GaAs HBT´s is investigated. Recombination due to Shockley-Read-Hall, Auger and radiative processes is considered. The interaction of the base-side SCR recombination currents with the neutral-base current and the collector current, which occurs via their dependence on the quasi-Fermi level splitting (ΔEfn) at the base-emitter junction, is not found to be a significant factor in the computation of ΔEfn. However, it is confirmed that the quasi-Fermi level splitting, as calculated from a balancing of the thermionic/tunnel current with the neutral base and collector currents, must subsequently be included in the computation of the base-side SCR currents if the current gain is not to be severely underestimated. A discussion of why the ideality factor is ≈1 for the base-side SCR currents is given. Finally, simple analytical expressions for ΔE fn and the SCR recombination currents are presented and should prove useful for HBT device- and circuit-simulation purposes
  • Keywords
    Auger effect; III-V semiconductors; aluminium compounds; electron-hole recombination; gallium arsenide; heterojunction bipolar transistors; semiconductor device models; space charge; tunnelling; AlGaAs-GaAs; Auger processes; HBT; Shockley-Read-Hall processes; collector current; current gain; emitter-base space-charge-region; ideality factor; neutral-base current; quasi-Fermi level splitting; radiative processes; space-charge-region recombination; thermionic/tunnel current balancing; Circuits; Councils; Electron emission; Equations; Helium; Heterojunction bipolar transistors; Physics computing; Spontaneous emission; Telecommunications; Thyristors;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.278498
  • Filename
    278498