• DocumentCode
    1058820
  • Title

    Transient behavior of Gunn domains and associated equivalent circuits

  • Author

    Freeman, Jon C. ; Jethwa, Chunilal P.

  • Author_Institution
    Bell Laboratories, North Andover, MA
  • Volume
    24
  • Issue
    12
  • fYear
    1977
  • fDate
    12/1/1977 12:00:00 AM
  • Firstpage
    1346
  • Lastpage
    1350
  • Abstract
    A new and more exact expression for the transient behavior of Gunn domains is found. General expressions for lumped-element values for an equivalent circuit are also presented. Some discrepancies between previously developed equivalent circuits are resolved. It is shown that the nonlinear equation describing the domain voltage may be put in the form of Abel´s equation. Limitations in the use of zero diffusion approximations in transient analysis is considered in detail.
  • Keywords
    Books; Equations; Equivalent circuits; Gunn devices; Helium; Physics; Semiconductor process modeling; Time factors; Transient response; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1977.19011
  • Filename
    1479203
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1058820