• DocumentCode
    1058839
  • Title

    Efficient ohmic boundary conditions for the Monte Carlo simulation of electron transport

  • Author

    Woolard, Dwight L. ; Tian, Hong ; Littlejohn, Michael A. ; Kim, Kiw

  • Author_Institution
    Dept. of Electr. & Comput. Eng., North Carolina State Univ., Raleigh, NC, USA
  • Volume
    41
  • Issue
    4
  • fYear
    1994
  • fDate
    4/1/1994 12:00:00 AM
  • Firstpage
    601
  • Lastpage
    606
  • Abstract
    The development of macroscopic transport models, accurate for studying hot-electron transport in semiconductors, involves a direct consideration of higher-moment terms. All hydrodynamic transport models (HTM´s), derived from moments of the Boltzmann transport equation, require the introduction of closure relations to terminate the resulting infinite set of macroscopic equations. These closure relations are used as analytical approximations to distributional-dependent integral coefficients. The most popular theoretical approach employed for the construction and evaluation of these higher-moment transport-parameter closures is the Monte Carlo (MC) method. Since the MC method is computationally intensive, the discovery and implementation of efficient MC modeling techniques (either numerical or physical) is of significant value. This paper reports on a relationship between device boundary conditions and the convergence range of higher-moment terms in time-independent MC simulations. Specifically, a set of ohmic BC´s which offer computational advantages is presented. This particular mathematical approach, which allows for two degrees of freedom, is shown to be more efficient in generating the full electron distribution function than conventional BC methods (i.e., strictly equilibrium-based)
  • Keywords
    Boltzmann equation; Monte Carlo methods; boundary-value problems; convergence; hot carriers; semiconductor device models; simulation; Boltzmann transport equation; Monte Carlo simulation; closure relations; convergence range; device boundary conditions; distributional-dependent integral coefficients; electron distribution function; electron transport; higher-moment terms; hot electrons; hydrodynamic transport models; ohmic boundary conditions; semiconductors; Boltzmann equation; Boundary conditions; Computational modeling; Convergence; Hydrodynamics; Integral equations; Monte Carlo methods; Numerical models; Physics computing; Termination of employment;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.278516
  • Filename
    278516