• DocumentCode
    1058850
  • Title

    Influence of avalanche buildup time in TRAPATT diodes

  • Author

    Chaturvedi, P.K. ; Khokle, W.S. ; Sisodia, M.L.

  • Author_Institution
    Vigyan Bhavan, Annexe, New Delhi, India
  • Volume
    24
  • Issue
    12
  • fYear
    1977
  • fDate
    12/1/1977 12:00:00 AM
  • Firstpage
    1360
  • Lastpage
    1362
  • Abstract
    Device equations for TRAPATT operation have been solved in a closed loop for optimization over the punch-through factor. Design triangles for various frequencies show design space for TRAPATT operation with optimized design near the apex of the triangles, and illustrate why it will be difficult to operate TRAPATT diodes at 20 GHz or higher.
  • Keywords
    Design optimization; Diodes; Frequency; Ionization; Plasma properties; Plasma temperature; Power generation; Steady-state; Thermal conductivity; Voltage control;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1977.19014
  • Filename
    1479206