DocumentCode :
105896
Title :
NAND Flash Memory/ReRAM Hybrid Unified Solid-State-Storage Architecture
Author :
Tanakamaru, Shuhei ; Doi, M. ; Takeuchi, Ken
Author_Institution :
Dept. of Electr., Electron., & Commun. Eng., Chuo Univ., Tokyo, Japan
Volume :
61
Issue :
4
fYear :
2014
fDate :
Apr-14
Firstpage :
1119
Lastpage :
1132
Abstract :
The proposed unified solid-state storage (USSS) with hybrid NAND flash memory/ReRAM provides high system-level data protection. In the conventional storage system, the hierarchical storage architecture (Server/Disk array/SSD/NAND flash memory) has duplicated functions. USSS solves this structural problem of the conventional enterprise-storage systems. The proposed unified storage controller integrates the duplicated functions (error corrections and redundancies). Five highly reliable techniques are presented; reverse-mirroring (RM), shift-mirroring (SM), error-reduction synthesis (ERS), page-RAID, and error-masking (EM). SM is a modified technique from RM with no ReRAM buffer. These technologies utilize error-patterns asymmetries of the NAND flash memory and fast, page-rewritable and high endurance ReRAM. RM, SM and EM are the mirroring techniques to reduce bit-errors of the NAND flash memory by intelligently allocating the write address and comparing the data in the primary/mirrored NAND flash memories, respectively. The page-RAID generates the block-parity in each block and EM records the error-location during read. Without mirroring, the acceptable raw BER of the NAND flash memory (ABER) increases by 4.4×. Moreover, when RM, ERS, page-RAID, and EM are applied, the ABER increases by 32×. This corresponds to an increase of the endurance or the data-retention time of the NAND flash memory by 4.2 or 34×.
Keywords :
NAND circuits; flash memories; random-access storage; block-parity; error-masking; error-patterns asymmetries; error-reduction synthesis; hierarchical storage architecture; hybrid NAND flash memory-ReRAM; page-RAID; reverse-mirroring; shift-mirroring; system-level data protection; unified solid-state storage; Arrays; Ash; Bit error rate; Microprocessors; Programming; Reliability; Big-data; NAND flash memory; ReRAM; reliability; storage;
fLanguage :
English
Journal_Title :
Circuits and Systems I: Regular Papers, IEEE Transactions on
Publisher :
ieee
ISSN :
1549-8328
Type :
jour
DOI :
10.1109/TCSI.2013.2285891
Filename :
6672022
Link To Document :
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