Title :
Improvements in resistance scaling at NIST using cryogenic current comparators
Author :
Dziuba, Ronald F. ; Elmquist, Randolph E.
Author_Institution :
Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
fDate :
4/1/1993 12:00:00 AM
Abstract :
Cryogenic current comparators (CCCs) are being used at NIST to verify Hamon-type resistance scaling techniques from 1 to 100 Ω, 1 kΩ, 6453.20 Ω, and 10 kΩ. Measurements comparing the 10/1, 64.532/1, and 100/1 ratios of CCCs to that of Hamon transfer ratios agree to ≈0.01 ppm, the practical limit of accuracy using Hamon transfer standards with conventional resistance bridges. The higher ration accuracies and sensitivities of CCC bridges will make it possible to lower the uncertainties associated with resistance scaling at NIST significantly
Keywords :
bridge instruments; electric resistance measurement; low-temperature techniques; measurement standards; 1 kohm; 1 to 100 ohm; 10 kohm; 6453.20 ohm; Hamon transfer ratios; Hamon-type resistance scaling; NIST; accuracies; cryogenic current comparators; resistance bridges; resistance scaling; sensitivities; Bridges; Connectors; Cryogenics; Electrical resistance measurement; Hall effect; Measurement standards; NIST; Q measurement; Resistors; Uncertainty;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
