• DocumentCode
    1059103
  • Title

    Secondary electron emission properties of conducting surfaces for use in multistage depressed collectors

  • Author

    Forman, R.

  • Author_Institution
    NASA Lewis Research Center, Cleveland, OH
  • Volume
    25
  • Issue
    1
  • fYear
    1978
  • fDate
    1/1/1978 12:00:00 AM
  • Firstpage
    69
  • Lastpage
    70
  • Abstract
    Secondary electron emission measurements were made in an Auger spectrometer, which allowed the surface chemical constituents to be determined also. Materials studied were beryllium, soot, pyrolytic graphite, copper, titanium carbide and, tantalum. Pyrolytic graphite roughened by sputter etching showed the most favorable results for depressed collector use.
  • Keywords
    Copper; Current measurement; Electron emission; Pollution measurement; Rough surfaces; Spectroscopy; Sputter etching; Surface cleaning; Surface roughness; Titanium;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1978.19038
  • Filename
    1479432
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1059103