Title :
Secondary electron emission properties of conducting surfaces for use in multistage depressed collectors
Author_Institution :
NASA Lewis Research Center, Cleveland, OH
fDate :
1/1/1978 12:00:00 AM
Abstract :
Secondary electron emission measurements were made in an Auger spectrometer, which allowed the surface chemical constituents to be determined also. Materials studied were beryllium, soot, pyrolytic graphite, copper, titanium carbide and, tantalum. Pyrolytic graphite roughened by sputter etching showed the most favorable results for depressed collector use.
Keywords :
Copper; Current measurement; Electron emission; Pollution measurement; Rough surfaces; Spectroscopy; Sputter etching; Surface cleaning; Surface roughness; Titanium;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1978.19038
