A method for measuring the permittivity without ambiguity using six-port reflectometer

Author

Munoz, Juan ; Rojo, Marta ; Margineda, Jose

Author_Institution

Dept. de Fisica, Murcia Univ., Spain

Volume

42

Issue

2

fYear

1993

fDate

4/1/1993 12:00:00 AM

Firstpage

222

Lastpage

226

Abstract

Automatic network analyzers are used for the broadband measurement of permittivity in different experimental arrangements. In many of them ambiguity appears because permittivity is calculated by solving a transcendental equation. This makes automatic measurements difficult. A method of eliminating this ambiguity is shown, with no additional experimental data required, except for a manipulation of the existing data. Theory and experimental results for low-loss dielectrics are shown for the short-circuited waveguide method using a six-port reflectometer. Errors are analyzed and several samples with permittivities of up to 16 are measured with an accuracy on the order of 1%

Keywords

measurement errors; microwave reflectometry; permittivity measurement; automatic measurements; broadband measurement; low-loss dielectrics; measurement errors; permittivity; short-circuited waveguide; six-port reflectometer; transcendental equation; Dielectric loss measurement; Dielectric measurements; Equations; Error analysis; Frequency measurement; Permittivity measurement; Solids; Thickness measurement; Waveguide theory; Wavelength measurement;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/19.278553

Filename

278553