DocumentCode
1059526
Title
A Mixed-Voltage Sensor Readout Circuit With On-Chip Calibration and Built-In Self-Test
Author
Mason, Andrew ; Chavan, Abhijeet V. ; Wise, Kensall D.
Author_Institution
Michigan State Univ., East Lansing
Volume
7
Issue
9
fYear
2007
Firstpage
1225
Lastpage
1232
Abstract
This paper reports a mixed-voltage mixed-signal chip for interfacing multiple capacitive transducers to embedded processors in integrated microsystems. A programmable switched-capacitor readout circuit accommodates capacitive sensors from 16 fF to 40 pF and allows self-test and online calibration. The 20 mm2 chip has a sensitivity of 1.25 mV/fF and is realized in a 1 mum n-well BiCMOS 2 P/2 M process that permits high-voltage operation, large-value resistors, and nonvolatile on-chip memory. An on-chip charge pump generates voltages up to 30 V that permits transducer electrostatic self-test. In normal operation mode, the chip provides a fast sensor readout consuming only 90 nj of energy, making it suitable for portable applications.
Keywords
BiCMOS integrated circuits; built-in self test; calibration; capacitive sensors; readout electronics; BiCMOS; built-in self-test; integrated microsystems; mixed-voltage sensor readout circuit; multiple capacitive transducers; on-chip calibration; on-chip charge pump; switched-capacitor readout circuit; transducer electrostatic self-test; BiCMOS integrated circuits; Built-in self-test; Calibration; Capacitive sensors; Charge pumps; Nonvolatile memory; Resistors; Switching circuits; Transducers; Voltage; Capacitive sensor; electrostatic force feedback; sensor interface; sensor self-test; switched-capacitor (SC);
fLanguage
English
Journal_Title
Sensors Journal, IEEE
Publisher
ieee
ISSN
1530-437X
Type
jour
DOI
10.1109/JSEN.2007.897957
Filename
4276695
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