• DocumentCode
    1059526
  • Title

    A Mixed-Voltage Sensor Readout Circuit With On-Chip Calibration and Built-In Self-Test

  • Author

    Mason, Andrew ; Chavan, Abhijeet V. ; Wise, Kensall D.

  • Author_Institution
    Michigan State Univ., East Lansing
  • Volume
    7
  • Issue
    9
  • fYear
    2007
  • Firstpage
    1225
  • Lastpage
    1232
  • Abstract
    This paper reports a mixed-voltage mixed-signal chip for interfacing multiple capacitive transducers to embedded processors in integrated microsystems. A programmable switched-capacitor readout circuit accommodates capacitive sensors from 16 fF to 40 pF and allows self-test and online calibration. The 20 mm2 chip has a sensitivity of 1.25 mV/fF and is realized in a 1 mum n-well BiCMOS 2 P/2 M process that permits high-voltage operation, large-value resistors, and nonvolatile on-chip memory. An on-chip charge pump generates voltages up to 30 V that permits transducer electrostatic self-test. In normal operation mode, the chip provides a fast sensor readout consuming only 90 nj of energy, making it suitable for portable applications.
  • Keywords
    BiCMOS integrated circuits; built-in self test; calibration; capacitive sensors; readout electronics; BiCMOS; built-in self-test; integrated microsystems; mixed-voltage sensor readout circuit; multiple capacitive transducers; on-chip calibration; on-chip charge pump; switched-capacitor readout circuit; transducer electrostatic self-test; BiCMOS integrated circuits; Built-in self-test; Calibration; Capacitive sensors; Charge pumps; Nonvolatile memory; Resistors; Switching circuits; Transducers; Voltage; Capacitive sensor; electrostatic force feedback; sensor interface; sensor self-test; switched-capacitor (SC);
  • fLanguage
    English
  • Journal_Title
    Sensors Journal, IEEE
  • Publisher
    ieee
  • ISSN
    1530-437X
  • Type

    jour

  • DOI
    10.1109/JSEN.2007.897957
  • Filename
    4276695