Title :
Mutual comparisons of fully automated Josephson-junction arrays voltage-standard systems
Author :
Iwasa, Akio ; Sakamoto, Yasuhiko ; Yoshida, Haruo ; Endo, Tadashi
Author_Institution :
Electrotech. Lab., Ibaraki, Japan
fDate :
4/1/1993 12:00:00 AM
Abstract :
In order to test the performances of three sets of fully automated Josephson-junction array voltage-standard systems, mutual comparisons among those systems are carried out. The results obtained show that each system is reasonably operated with the assigned uncertainty of about one part in 108 in routine daily calibration of Zener-diode voltage standards
Keywords :
Josephson effect; calibration; measurement standards; voltage measurement; Zener-diode voltage standards; automated Josephson-junction arrays; daily calibration; uncertainty; voltage-standard; Assembly systems; Calibration; Detectors; Josephson junctions; Laboratories; Manuals; Measurement standards; System testing; Uncertainty; Voltage;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
