• DocumentCode
    1059692
  • Title

    Spectral line shape analysis and systematic frequency shifts of laser frequency standards

  • Author

    Pendrill, Leslie R. ; Kärn, Ulf

  • Author_Institution
    Swedish Nat. Testing & Res. Inst., Boras, Sweden
  • Volume
    42
  • Issue
    2
  • fYear
    1993
  • fDate
    4/1/1993 12:00:00 AM
  • Firstpage
    415
  • Lastpage
    419
  • Abstract
    A practical realization of the unit of length often relies on values of the frequency of optical frequency standards in the form of frequency stabilized lasers. A technique of frequency stabilization commonly used for He-Ne lasers at 633 nm stabilized in frequency to hyperfine spectral components in the saturated absorption spectrum of molecular iodine is that based on phase-sensitive detection at the third harmonic of a modulation frequency. A systematic study is made of how frequency shifts are related to observations of offset voltages in the feedback loop which vary across the iodine spectrum. A simple model based on spectral line shape analysis is found to apply to a variety of lasers possessing moderate offsets
  • Keywords
    frequency measurement; helium; iodine; laser beam applications; laser frequency stability; measurement standards; molecular hyperfine structure; molecular spectral line breadth; neon; optical harmonic generation; optical modulation; spectra of diatomic inorganic molecules; spectral line shift; 633 nm; He-Ne lasers; I2; feedback loop; frequency shifts; frequency stabilization; frequency stabilized lasers; hyperfine spectral components; laser frequency standards; model; modulation frequency; offset voltages; optical frequency standards; phase-sensitive detection; saturated absorption spectrum; spectral line shape analysis; third harmonic; unit of length; Absorption; Laser stability; Optical feedback; Optical modulation; Optical saturation; Phase detection; Phase frequency detector; Phase modulation; Shape; Spectral analysis;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/19.278594
  • Filename
    278594