DocumentCode
1059785
Title
Interpretation of X-Ray Line Profile of Polycrystalline
Author
Hanafusa, Kei ; Yamamoto, Akiyasu ; Ogino, Hiraku ; Horii, Shigeru ; Shimoyama, Jun-ichi ; Kishio, Kohji
Author_Institution
Dept. of Appl. Chem., Univ. of Tokyo, Tokyo, Japan
Volume
19
Issue
3
fYear
2009
fDate
6/1/2009 12:00:00 AM
Firstpage
2690
Lastpage
2693
Abstract
XRD peak profile analysis was performed on polycrystalline MgB2 bulks and tapes manufactured by various heat treatment conditions in order to investigate statistical value of crystallite size. Volume-weighted and area-weighted mean diameter of a bulk sample heated at 600degC for 6 h were estimated to be approximately 90 nm and 20 nm, respectively. These suggest that crystallite size distribution of MgB2 is very wide, although a lot of very small crystallites exist. Similar tendencies were observed for other samples. On the other hand J c values were found to be rather low compared to the expected values considering its small D a . This indicates that a small portion of crystallite interfaces act as effective pinning centers.
Keywords
X-ray diffraction; critical current density (superconductivity); crystallites; flux pinning; grain size; heat treatment; magnesium compounds; sintering; superconducting critical field; superconducting materials; superconducting tapes; MgB2; X-ray line profile; area-weighted mean diameter; critical current density; crystallite size; flux pinning force; grain size; heat treatment; mono-core superconducting tapes; pinning centers; polycrystalline superconducting materials; powder-in-closed-tube method; sintering; temperature 600 C; time 6 h; upper critical field; volume-weighted mean diameter; Crystallite size; X-ray line profile analysis; magnesium diboride; polycrystalline bulks and tapes;
fLanguage
English
Journal_Title
Applied Superconductivity, IEEE Transactions on
Publisher
ieee
ISSN
1051-8223
Type
jour
DOI
10.1109/TASC.2009.2018116
Filename
5067108
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