Measurements of residual defects and 1/f noise in ion-implanted p-channel MOSFET´s

This paper describes the measurements of excess noise and residual defects of extremely low concentrations (<1 × 10⁹cm^-2) in ion-implanted p-channel MOSFET\´s. The activation energy and the density of the residual defects after high-temperature annealing were measured using a transient capacitance technique. The test FET\´s were ion-implanted with fluences of 5 × 10¹¹to 4 × 10¹²using³¹p⁺,¹¹B⁺, or²⁸Si⁺species. A post-implant anneal was carried out in an N2or an Ar ambient for 20 min at various temperatures. For¹¹B⁺-implanted MOSFET\´s after annealing above 1000°C, a high residual defect concentration was observed near the conduction band edge; whereas after annealing the defect density as a result of²⁸Si⁺or³¹p⁺implantation was equal to that of control MOSFET\´s. The density-of-state data agree with the equilibrium measurements of excess ( ) noise power. The excess noise was measured as a function of the drain current. The distribution of noise power versus potential minimum of holes in the equilibrium condition is similar to that of interface state density. In nonequilibrium operation, a reduction of excess noise was achieved owing to the presence of buried channel created by ion implant.