An accurate and repeatable technique for noise parameter measurements

Author

Boudiaf, Ali ; Laporte, Michel

Author_Institution

CNET, France Telecom, Bagneux, France

Volume

42

Issue

2

fYear

1993

fDate

4/1/1993 12:00:00 AM

Firstpage

532

Lastpage

537

Abstract

In spite of the improvements in RF instrumentation, network analyzer calibration methods, and measurement techniques, the measurement of noise parameters in highly mismatched systems is particularly prone to error. A homemade automated noise parameter measurement system is described, and a new algorithm for the estimation of the two-port noise parameters is presented. Analytical calculation of the parameter accuracy is developed, by taking into account the measurement uncertainties. The accuracy and the repeatability of the measurements performed with a low-noise HEMT are presented

Keywords

calibration; computerised instrumentation; electric noise measurement; high electron mobility transistors; least squares approximations; measurement errors; microwave measurement; network analysers; parameter estimation; semiconductor device noise; semiconductor device testing; HEMT; RF instrumentation; accuracy; algorithm; estimation; least squares approximation; measurement uncertainties; mismatched systems; network analyzer calibration; noise measurement; noise parameter measurements; repeatability; semiconductor device; two-port noise parameters; Calibration; Impedance measurement; Instruments; Measurement techniques; Noise figure; Noise measurement; Optimization methods; Particle measurements; Radio frequency; Tuners;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/19.278618

Filename

278618