Title :
International comparisons of Josephson array voltage standards
Author :
Reymann, Dominique ; Witt, Thomas J.
Author_Institution :
Bur. Int. des Poids et Mesures, Sevres, France
fDate :
4/1/1993 12:00:00 AM
Abstract :
Comparisons of 1-V Josephson array voltage standards provide a good estimate of some of the limiting factors in the uncertainties of such devices. The BIPM has participated in nine such international comparisons. This program was preceded and followed by the comparison of the two BIPM Josephson array devices. A summary of the results, which shows agreement at the level of 1-7 parts in 1010, is presented. Some of the problems encountered are discussed
Keywords :
Josephson effect; measurement standards; superconducting integrated circuits; superconducting junction devices; voltage measurement; BIPM; Josephson array voltage standards; international comparisons; mm-wave measurement; uncertainties; Detectors; Electrical resistance measurement; Josephson junctions; Laboratories; Measurement standards; Metrology; Sensor arrays; Temperature; Velocity measurement; Voltage;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
