• DocumentCode
    1060275
  • Title

    An analysis of wide-band transferred electron devices

  • Author

    Aishima, Asuo ; Yokoo, Kuniyoshi ; Ono, Shoichi

  • Author_Institution
    Hiroshima University, Hiroshima, Japan
  • Volume
    25
  • Issue
    6
  • fYear
    1978
  • fDate
    6/1/1978 12:00:00 AM
  • Firstpage
    640
  • Lastpage
    645
  • Abstract
    The trapping conditions of a high-field domain at the anode are studied by varying doping density, applied bias voltage, and doping notch depth and width near the cathode. It is shown that the frequency band of negative conductance of the trapped-domain mode depends significantly on the doping density, and a diode having the doping density of 3 × 1015/cm3exhibits the negative conductance over the wide range from 4 GHz to 42 GHz. The upper frequency limit of the negative conductance is due to the series resistance in the low-field region and the lower limit is determined by carrier transit-time effects in high-field region. The operation mode of a trapped-domain diode will change into a traveling dipole or accumulation mode from a trapped-domain mode depending on the doping density and the operation frequency for a large-signal operation.
  • Keywords
    Anodes; Cathodes; Computer simulation; Diodes; Doping; Electron traps; Frequency dependence; Gunn devices; Voltage; Wideband;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1978.19148
  • Filename
    1479542