• DocumentCode
    1060363
  • Title

    Post-Placement Interconnect Entropy

  • Author

    Feng, Wenyi ; Greene, Jonathan W.

  • Author_Institution
    Actel Corp., Mountain View
  • Volume
    15
  • Issue
    8
  • fYear
    2007
  • Firstpage
    945
  • Lastpage
    948
  • Abstract
    We introduce the concept of post-placement interconnect entropy: the minimal number of bits required to describe a well-placed netlist, which has connection lengths distributed according to Rent´s rule. The entropy is a function of the number N of cells in the netlist and the Rent exponent p. We derive an expression for the entropy per cell and show that it converges as N approaches infinity. The entropy provides an achievable lower bound on the number of configuration bits in a programmable logic device (PLD) [or field-programmable gate array (FPGA)] and a useful measure of its routing flexibility. Specific numerical values are computed for practical situations. For example, any scalable FPGA composed of 4-input lookup table cells would require 31 configuration bits per cell. We compare this to the actual number of configuration bits in a standard FPGA architecture. We generalize the bound to dimensions higher than two, and show that for any p there is an optimal dimension that minimizes the bound.
  • Keywords
    entropy; field programmable gate arrays; integrated circuit interconnections; logic design; programmable logic devices; FPGA; PLD; Rent rule; configuration bits; field-programmable gate array; lookup table; post-placement interconnect entropy; programmable logic device; routing flexibility; well-placed netlist; Decoding; Entropy; Field programmable gate arrays; H infinity control; Integrated circuit interconnections; Programmable logic arrays; Programmable logic devices; Routing; Switches; Table lookup; Entropy; field-programmable gate array (FPGA); interconnections; placement; programmable logic device (PLD);
  • fLanguage
    English
  • Journal_Title
    Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1063-8210
  • Type

    jour

  • DOI
    10.1109/TVLSI.2007.900747
  • Filename
    4276778