DocumentCode
1060425
Title
Spot optical measurements on micromachined mirrors for photonic switching
Author
Annovazzi-Lodi, Valerio ; Benedetti, Mauro ; Merlo, Sabina ; Norgia, Michele
Author_Institution
Dipt. di Elettronica, Universita degli Studi di Pavia, Italy
Volume
10
Issue
3
fYear
2004
Firstpage
536
Lastpage
544
Abstract
This paper describes and compares three optical methods for performing spot measurements on micromachined mirrors, designed for photonic switching in fiberoptic networks. For static characterization, two spot-position detection systems, one based on a vidicon camera and the other based on a bidimensional silicon position sensitive detector (PSD), are illustrated, tested, and compared. Moreover, the dynamic behavior has been monitored with the PSD-based detection arrangement and with a semiconductor laser feedback interferometer. Advantages and drawbacks of these methods are highlighted. Testing is reported on torsional, silicon micromachined mirrors, with a single degree of freedom. High dc voltage for static measurements, and sinusoidal or white-noise or step excitation for dynamic characterization, have been used for mirror driving.
Keywords
light interferometers; light interferometry; micromechanical devices; micromirrors; optical fibre networks; optical testing; optical variables measurement; photonic switching systems; television camera tubes; white noise; bidimensional silicon position sensitive detector; fiberoptic networks; microelectromechanical systems; micromirror; mirror driving; photonic switching; semiconductor laser feedback interferometer; silicon micromachined mirrors; sinusoidal noise; spot measurements; spot optical measurements; spot-position detection systems; static characterization; step excitation; torsional micromachined mirrors; vidicon camera; white noise; Laser feedback; Mirrors; Optical design; Optical feedback; Optical fiber networks; Optical interferometry; Optical sensors; Performance evaluation; Position sensitive particle detectors; Silicon; Interferometry; MEMS; MEMS testing; MOEMS; characterization; microelectromechanical systems; microoptoelectromechanical systems; optical measurements;
fLanguage
English
Journal_Title
Selected Topics in Quantum Electronics, IEEE Journal of
Publisher
ieee
ISSN
1077-260X
Type
jour
DOI
10.1109/JSTQE.2004.830625
Filename
1323058
Link To Document