Title :
Experimental Study of the Effect of Flux Trapping on the Operation of RSFQ Circuits
Author :
Ebert, Bjoern ; Ortlepp, Thomas ; Uhlmann, F.Hermann
Author_Institution :
RSFQ Design Group, Ilmenau Univ. of Technol., Ilmenau, Germany
fDate :
6/1/2009 12:00:00 AM
Abstract :
This paper investigates the robustness of different ground plane configurations of superconducting circuits against magnetic flux trapping. The robustness of the circuit is determined by the change of the error rate at a specific operating point under the influence of an external magnetic field. A large number of thermocycles are used to determine the statistic properties of the error rate. The proposed measurement setup allows a fast scan of a two-dimensional operating area.
Keywords :
magnetic flux; quantum optics; superconducting junction devices; superconducting logic circuits; Josephson junction; RSFQ circuit; error rate measurement; external magnetic field; ground plane configuration; magnetic flux trapping effect; rapid single flux quantum electronic; superconducting circuit; thermocycles; Error rate measurements; Josephson junction; RSFQ; superconducting circuits; trapped flux;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
DOI :
10.1109/TASC.2009.2018738
