Title :
Special Section on the International Symposium for Quality Electronic Design 2007 (ISQED 2007)
Author :
Wright, Paul ; Hector, S.
Abstract :
The eight papers in this special section were selected from those presented at the International Symposium for Quality Electronic Design 2007 (ISQED 2007).
Keywords :
Circuit testing; Design methodology; Integrated circuit technology; Integrated circuit yield; Manufacturing processes; Parasitic capacitance; Process design; Semiconductor process modeling; Special issues and sections; Timing;
Journal_Title :
Semiconductor Manufacturing, IEEE Transactions on
DOI :
10.1109/TSM.2007.913185
