• DocumentCode
    1060469
  • Title

    Special Section on the International Symposium for Quality Electronic Design 2007 (ISQED 2007)

  • Author

    Wright, Paul ; Hector, S.

  • Volume
    21
  • Issue
    1
  • fYear
    2008
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    The eight papers in this special section were selected from those presented at the International Symposium for Quality Electronic Design 2007 (ISQED 2007).
  • Keywords
    Circuit testing; Design methodology; Integrated circuit technology; Integrated circuit yield; Manufacturing processes; Parasitic capacitance; Process design; Semiconductor process modeling; Special issues and sections; Timing;
  • fLanguage
    English
  • Journal_Title
    Semiconductor Manufacturing, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0894-6507
  • Type

    jour

  • DOI
    10.1109/TSM.2007.913185
  • Filename
    4447303
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1060469