• DocumentCode
    106056
  • Title

    A Low-Power Low-VDD Nonvolatile Latch Using Spin Transfer Torque MRAM

  • Author

    Kejie Huang ; Yong Lian

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Nat. Univ. of Singapore, Singapore, Singapore
  • Volume
    12
  • Issue
    6
  • fYear
    2013
  • fDate
    Nov. 2013
  • Firstpage
    1094
  • Lastpage
    1103
  • Abstract
    The high leakage power due to the scaling down of the process nodes has been one of the critical issues in CMOS circuits, especially in the sleep power critical systems. The emerging nonvolatile flip-flops (nvFFs) with fast saving and restoration speed and zero sleep power may be the solution to address the high sleep power issue. However, the “source degeneration” and/or “serial write” issues of the reported works may significantly limit the scalability. We propose a novel nvFF using two-phase write approach and complementary write drivers, which reduces more than 38% power for the saving operation and also scales VDD down to 1 V and below. Our proposed nvFF has the closest flip-flop (FF) performance as the CMOS retention FF. Moreover, it has more than 50% area reduction compared to the smallest nvFF in the prior arts.
  • Keywords
    CMOS digital integrated circuits; MRAM devices; flip-flops; low-power electronics; CMOS circuits; complementary write drivers; low-power low-VDD nonvolatile latch; nonvolatile flip-flops; nvFF; restoration speed; saving operation; serial write issues; sleep power critical systems; source degeneration issues; spin transfer torque MRAM; two-phase write approach; zero sleep power; Latches; Magnetic tunneling; Nonvolatile memory; Switches; Switching circuits; Torque; Transistors; Low power; nonvolatile flip-flop (nvFF); nonvolatile latch (nvLatch); nonvolatile memory (NVM); spin-torque transfer MRAM (STT-MRAM); two-phase write approach;
  • fLanguage
    English
  • Journal_Title
    Nanotechnology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1536-125X
  • Type

    jour

  • DOI
    10.1109/TNANO.2013.2280338
  • Filename
    6588301