DocumentCode
1060734
Title
Response of magnetization to high frequency excitation in inductive thin-film recording heads
Author
Shi, Xizeng ; Koeppe, Peter V. ; Kryder, Mark H.
Author_Institution
Data Storage Syst. Center, Carnegie Mellon Univ., Pittsburgh, PA, USA
Volume
27
Issue
6
fYear
1991
fDate
11/1/1991 12:00:00 AM
Firstpage
4942
Lastpage
4944
Abstract
A scanning magnetooptic photometer system was used to study the high-frequency response of magnetization in inductive thin-film recording heads. Measurements at 40 MHz show that most domain walls cease to move at this frequency. At the surface of these motionless walls, the magnetization does not respond to the applied field, forming a dead surface layer. On the two sides of these motionless domain walls, magnetic flux conduction is by nonuniform rotation in the sense that both the rotation angle and the phase are different at different places, forming magnetic flux ripples. Locked ripple was previously shown to significantly slow magnetization reversal in thin Permalloy films, and these measurement results indicate it will likely limit high-frequency performance of thin-film heads as well
Keywords
magnetic domain walls; magnetic heads; magnetic switching; magnetic thin film devices; magnetisation reversal; 40 MHz; dead surface layer; domain wall movement; high frequency excitation; high-frequency response; inductive thin-film recording heads; magnetic flux conduction; magnetic flux ripples; magnetic heads; magnetization; magnetization reversal; motionless walls; nonuniform rotation; scanning magnetooptic photometer system; thin Permalloy films; Frequency measurement; Magnetic domain walls; Magnetic field measurement; Magnetic films; Magnetic flux; Magnetic heads; Magnetization reversal; Magnetooptic recording; Photometry; Transistors;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/20.278703
Filename
278703
Link To Document