Title :
Significance of δM measurements in thin film media
Author :
Beardsley, I.A. ; Zhu, Jian-Gang
Author_Institution :
IBM Almaden Res. Center, San Jose, CA, USA
fDate :
11/1/1991 12:00:00 AM
Abstract :
Remanence measurements have been proposed as a means of estimating the amount of intergranular exchange present in thin-film recording media. A micromagnetic model is used to compute remanence curves starting from a DC-saturated state and an AC-erased state, for a range of media parameters. It is found that the amount of intergranular exchange is the most important parameter determining the difference δM between these two curves; however, the interpretation is clouded somewhat by the effect of anisotropy and other parameters
Keywords :
magnetic anisotropy; magnetic recording; remanence; AC-erased state; DC-saturated state; anisotropy; intergranular exchange; micromagnetic model; recording media; remanence curves; thin film media; Anisotropic magnetoresistance; Chromium; Couplings; Demagnetization; Magnetic noise; Micromagnetics; Noise measurement; Remanence; Shape; Transistors;
Journal_Title :
Magnetics, IEEE Transactions on
