• DocumentCode
    1061354
  • Title

    A hybrid mass-interconnection method by electroplating

  • Author

    Wu, Shu-Yau

  • Author_Institution
    Westinghouse Research and Development Center, Pittsburgh, PA
  • Volume
    25
  • Issue
    10
  • fYear
    1978
  • fDate
    10/1/1978 12:00:00 AM
  • Firstpage
    1201
  • Lastpage
    1203
  • Abstract
    A novel mass-interconnection method is described. The method utilizes electroplating of thin-film metallizations to interconnect simultaneously large numbers of small contacts via electroplated bridges. The bridges can be formed between similar or dissimilar materials; for instance, infrared detectors and charge-coupled devices in a hybrid circuit. The unique method eliminates difficulties in joining small and closely spaced contacts, particularly in the fabrication of focal plane structures for infrared imaging systems. Detailed fabrication steps, mechanism, advantages, and potential applications of the method are reported.
  • Keywords
    Bonding; Bridge circuits; Charge coupled devices; Contacts; Detectors; Integrated circuit interconnections; Metallization; Silicon; Tellurium; Tin;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1978.19252
  • Filename
    1479646