DocumentCode :
1061354
Title :
A hybrid mass-interconnection method by electroplating
Author :
Wu, Shu-Yau
Author_Institution :
Westinghouse Research and Development Center, Pittsburgh, PA
Volume :
25
Issue :
10
fYear :
1978
fDate :
10/1/1978 12:00:00 AM
Firstpage :
1201
Lastpage :
1203
Abstract :
A novel mass-interconnection method is described. The method utilizes electroplating of thin-film metallizations to interconnect simultaneously large numbers of small contacts via electroplated bridges. The bridges can be formed between similar or dissimilar materials; for instance, infrared detectors and charge-coupled devices in a hybrid circuit. The unique method eliminates difficulties in joining small and closely spaced contacts, particularly in the fabrication of focal plane structures for infrared imaging systems. Detailed fabrication steps, mechanism, advantages, and potential applications of the method are reported.
Keywords :
Bonding; Bridge circuits; Charge coupled devices; Contacts; Detectors; Integrated circuit interconnections; Metallization; Silicon; Tellurium; Tin;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1978.19252
Filename :
1479646
Link To Document :
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