DocumentCode
1061354
Title
A hybrid mass-interconnection method by electroplating
Author
Wu, Shu-Yau
Author_Institution
Westinghouse Research and Development Center, Pittsburgh, PA
Volume
25
Issue
10
fYear
1978
fDate
10/1/1978 12:00:00 AM
Firstpage
1201
Lastpage
1203
Abstract
A novel mass-interconnection method is described. The method utilizes electroplating of thin-film metallizations to interconnect simultaneously large numbers of small contacts via electroplated bridges. The bridges can be formed between similar or dissimilar materials; for instance, infrared detectors and charge-coupled devices in a hybrid circuit. The unique method eliminates difficulties in joining small and closely spaced contacts, particularly in the fabrication of focal plane structures for infrared imaging systems. Detailed fabrication steps, mechanism, advantages, and potential applications of the method are reported.
Keywords
Bonding; Bridge circuits; Charge coupled devices; Contacts; Detectors; Integrated circuit interconnections; Metallization; Silicon; Tellurium; Tin;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1978.19252
Filename
1479646
Link To Document