Title :
Magnetic force microscopy of recording heads
Author :
Wago, K. ; Sueoka, K. ; Sai, F.
Author_Institution :
IBM Tokyo Res. Lab., Japan
fDate :
11/1/1991 12:00:00 AM
Abstract :
Magnetic force microscopy (MFM) images of a thin-film head and metal-in-gap (MIG) heads are presented. Results for the thin-film head show that it is possible to image a high-frequency magnetic field up to at least 50 MHz by using an iron-coated tip. MFM images of the MIG heads indicate intrinsic features such as the effect of the high saturation magnetic flux density of Sendust, a magnetic boundary at the interface of the Sendust and ferrite, electrical resonance, and a frequency limit beyond which heads cannot excite magnetic fields
Keywords :
magnetic force microscopy; magnetic heads; magnetic thin film devices; magnetisation; 50 MHz; Sendust; electrical resonance; frequency limit; high saturation magnetic flux density; high-frequency magnetic field; intrinsic features; magnetic boundary; magnetic force microscopy; magnetic recording heads; metal-in-gap heads; thin-film head; Ferrites; Magnetic fields; Magnetic films; Magnetic flux; Magnetic flux density; Magnetic force microscopy; Magnetic forces; Magnetic heads; Magnetic recording; Saturation magnetization;
Journal_Title :
Magnetics, IEEE Transactions on
