Title :
Interpretation of magnetic domain images and electron diffraction patterns in Lorentz microscopy
Author :
Byun, C. ; Rauch, G.C. ; Ramaswamy, S. ; Greggi, J., Jr.
Author_Institution :
Digital Equipment Corp., Colorado Springs, CO, USA
fDate :
11/1/1991 12:00:00 AM
Abstract :
Lorentz TEM (transmission electron microscopy) images and associated electron diffraction patterns of magnetic domains recorded on thin-film media under various conditions are described. Various patterns of deflected diffraction spots are observed, depending on the state of magnetization of the specimen. Black and white contrast in Foucault images is controlled by the position of the aperture and results from both the magnetization distribution in the ferromagnetic thin-film specimen and the fringing fields above and below the specimen. Also shown is the effect of overwrite currents on the domain images
Keywords :
electron diffraction examination of materials; hard discs; magnetic domains; magnetic thin films; magnetisation; transmission electron microscope examination of materials; transmission electron microscopy; Foucault images; Lorentz microscopy; TEM; deflected diffraction spots; domain images; effect of overwrite currents; electron diffraction patterns; fringing fields; magnetic domain images; magnetization distribution; thin-film media; Apertures; Control systems; Diffraction; Electron beams; Electron microscopy; Lenses; Lighting; Magnetic domains; Magnetic force microscopy; Magnetization;
Journal_Title :
Magnetics, IEEE Transactions on
