DocumentCode :
1061710
Title :
Development of Integrated HTS SQUIDs With a Multilayer Structure and Ramp-Edge Josephson Junctions
Author :
Wakana, Hironori ; Adachi, S. ; Hata, Kiyoshi ; Hato, Tsunehiro ; Tarutani, Yoshinobu ; Tanabe, Keiichi
Author_Institution :
Supercond. Res. Lab., ISTEC, Tokyo, Japan
Volume :
19
Issue :
3
fYear :
2009
fDate :
6/1/2009 12:00:00 AM
Firstpage :
782
Lastpage :
785
Abstract :
We have fabricated high-temperature superconductor (HTS) dc superconducting quantum interference devices (SQUIDs) with a multilayer structure and ramp-edge Josephson junctions. For stable operation at 77 K, SmBa2Cu3Oy (SmBCO) and La0.1-Er0.95Ba1.95Cu3Oy (La-ErBCO) films with a T c above 90 K were employed as materials for the base-electrode and counter-electrode layers, respectively. Junctions were fabricated by employing a Cu-poor La-ErBCO layer as a precursor of the barrier. The fabricated parallel gradiometers with a baseline of 1-3 mm exhibited the field-induced modulation voltage of 20-50 muV at 77 K, and a clear modulation up to 86.8 K. Noise measurements at 77 K revealed a white flux noise of 4.5-10 muPhi0/Hz1/2 at 1 kHz. The magnetometer with an integrated 20-turn flux transformer and the effective area of about 1.8 mm2 exhibited a field noise of 25 fT/Hz1/2 or less at 1 kHz.
Keywords :
Josephson effect; SQUID magnetometers; high-temperature superconductors; superconducting device noise; counter-electrode layers; field-induced modulation voltage; frequency 1 kHz; integrated HTS SQUIDs; ramp-edge Josephson junctions; size 1 mm to 3 mm; superconducting quantum interference devices; temperature 77 K; white flux noise; High-temperature superconductors; SQUIDs; superconducting device fabrication; superconducting device noise;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/TASC.2009.2019077
Filename :
5067272
Link To Document :
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