DocumentCode
1061851
Title
First Internal Spacers\´ Introduction in Record High
Gate Multichannel MOSFET Satisfying Both High-Performance and Low Standby
Author
Bernard, Emilie ; Ernst, Thomas ; Guillaumot, Bernard ; Vulliet, Nathalie ; Lim, Tao Chuan ; Rozeau, Olivier ; Danneville, Francois ; Coronel, Philippe ; Skotnicki, Thomas ; Deleonibus, Simon ; Faynot, Olivier
Author_Institution
STMicroelectronics, Crolles
Volume
30
Issue
2
fYear
2009
Firstpage
148
Lastpage
151
Abstract
For the first time, internal spacers have been introduced in multichannel CMOSFET (MCFET) structures, featuring a decrease of the intrinsic CV/I delay by 39%. The process steps introduced for this new MCFET technological option are studied and optimized in order to achieve excellent ION/IOFF characteristics (NMOS: 2.33 mA/mum at 27 pA/mum and PMOS: 1.52 mA/mum at 38 pA/mum). A gate capacitance C gg reduction of 32% is measured, thanks to S-parameter extraction. Moreover, a significant improvement of the analogical figure of merit is measured compared with optimized fully depleted silicon-on-insulator planar reference; the voltage gain A VI( = gm/g ds) is improved by 92%.
Keywords
MOSFET; S-parameters; capacitance measurement; hafnium compounds; semiconductor device measurement; silicon-on-insulator; titanium compounds; ION-IOFF characteristics; MCFET; S-parameter extraction; Si-SiO2; TiN-HfO2; gate capacitance; internal spacer; intrinsic CV-I delay; multichannel CMOSFET structure; silicon-on-insulator; 3-D; $CV/I$ ; $A_{rm VI}$ ; $C_{rm gg}$ ; high performances; internal spacers; low standby power; multichannel CMOSFETs (MCFETs);
fLanguage
English
Journal_Title
Electron Device Letters, IEEE
Publisher
ieee
ISSN
0741-3106
Type
jour
DOI
10.1109/LED.2008.2009008
Filename
4745791
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