• DocumentCode
    1061851
  • Title

    First Internal Spacers\´ Introduction in Record High I_{\\rm ON}/I_{\\rm OFF} \\hbox {TiN/HfO}_{2} Gate Multichannel MOSFET Satisfying Both High-Performance and Low Standby

  • Author

    Bernard, Emilie ; Ernst, Thomas ; Guillaumot, Bernard ; Vulliet, Nathalie ; Lim, Tao Chuan ; Rozeau, Olivier ; Danneville, Francois ; Coronel, Philippe ; Skotnicki, Thomas ; Deleonibus, Simon ; Faynot, Olivier

  • Author_Institution
    STMicroelectronics, Crolles
  • Volume
    30
  • Issue
    2
  • fYear
    2009
  • Firstpage
    148
  • Lastpage
    151
  • Abstract
    For the first time, internal spacers have been introduced in multichannel CMOSFET (MCFET) structures, featuring a decrease of the intrinsic CV/I delay by 39%. The process steps introduced for this new MCFET technological option are studied and optimized in order to achieve excellent ION/IOFF characteristics (NMOS: 2.33 mA/mum at 27 pA/mum and PMOS: 1.52 mA/mum at 38 pA/mum). A gate capacitance C gg reduction of 32% is measured, thanks to S-parameter extraction. Moreover, a significant improvement of the analogical figure of merit is measured compared with optimized fully depleted silicon-on-insulator planar reference; the voltage gain A VI( = gm/g ds) is improved by 92%.
  • Keywords
    MOSFET; S-parameters; capacitance measurement; hafnium compounds; semiconductor device measurement; silicon-on-insulator; titanium compounds; ION-IOFF characteristics; MCFET; S-parameter extraction; Si-SiO2; TiN-HfO2; gate capacitance; internal spacer; intrinsic CV-I delay; multichannel CMOSFET structure; silicon-on-insulator; 3-D; $CV/I$; $A_{rm VI}$; $C_{rm gg}$; high performances; internal spacers; low standby power; multichannel CMOSFETs (MCFETs);
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/LED.2008.2009008
  • Filename
    4745791