DocumentCode :
106199
Title :
A Survey of Wide Bandgap Power Semiconductor Devices
Author :
Millan, James ; Godignon, P. ; Perpina, Xavier ; Perez-Tomas, Amador ; Rebollo, Jose
Author_Institution :
Inst. de Microelectron. de Barcelona-Centre Nac. de Microelectron. (IMB-CNM), Univ. Autonoma de Barcelona, Bellaterra, Spain
Volume :
29
Issue :
5
fYear :
2014
fDate :
May-14
Firstpage :
2155
Lastpage :
2163
Abstract :
Wide bandgap semiconductors show superior material properties enabling potential power device operation at higher temperatures, voltages, and switching speeds than current Si technology. As a result, a new generation of power devices is being developed for power converter applications in which traditional Si power devices show limited operation. The use of these new power semiconductor devices will allow both an important improvement in the performance of existing power converters and the development of new power converters, accounting for an increase in the efficiency of the electric energy transformations and a more rational use of the electric energy. At present, SiC and GaN are the more promising semiconductor materials for these new power devices as a consequence of their outstanding properties, commercial availability of starting material, and maturity of their technological processes. This paper presents a review of recent progresses in the development of SiC- and GaN-based power semiconductor devices together with an overall view of the state of the art of this new device generation.
Keywords :
III-V semiconductors; gallium compounds; power semiconductor devices; silicon compounds; wide band gap semiconductors; GaN; SiC; power converter applications; power device operation; semiconductor materials; superior material properties; wide bandgap power semiconductor devices; BJTs; GaN; HEMTs; IGBTs; JFETs; MOSFETs; SiC; diodes; power devices; thyristors; wide bandgap (WBG) semiconductors;
fLanguage :
English
Journal_Title :
Power Electronics, IEEE Transactions on
Publisher :
ieee
ISSN :
0885-8993
Type :
jour
DOI :
10.1109/TPEL.2013.2268900
Filename :
6532359
Link To Document :
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