DocumentCode :
1061998
Title :
Recording properties of multilayered thin film media
Author :
Palmer, D.C. ; Johnson, K.E. ; Wu, E.Y. ; Peske, J.V.
Author_Institution :
IBM Storage Syst. Products Div., Rochester, MN, USA
Volume :
27
Issue :
6
fYear :
1991
fDate :
11/1/1991 12:00:00 AM
Firstpage :
5307
Lastpage :
5309
Abstract :
The recording properties of layered film media, including the bit error rate, have been measured for comparison with the results found on single layer film media. This investigation centered on the ability of magnetostatic coupling between layers to affect the magnetic performance in ways other than noise reduction. Multilayered magnetic films were fabricated with interlayer thickness from 25 to 330 Å and with one to six magnetic layers using a CoPtCr alloy on a Cr underlayer. In most tests the single layer media perform better than the multilayer media, but the differences are small and do not appear to influence the error rate significantly. The largest distinguishing feature. is the improvement in the signal-to-noise ratio which comes from two thin layers that are coupled magnetostatically. This leads to an improvement of up to four orders of magnitude in the bit error rate for the bilayer media. Increasing the number of layers gives additional improvement
Keywords :
chromium; chromium alloys; cobalt alloys; magnetic disc storage; magnetic recording; magnetic thin films; platinum alloys; sputtered coatings; 25 to 330 angstrom; CoPtCr-Cr layers; bilayer media; bit error rate; interlayer thickness; magnetic performance; magnetic recording properties; magnetostatic coupling; multilayer discs; multilayered thin film media; signal-to-noise ratio; single layer media; sputtered layers; Bit error rate; Chromium alloys; Couplings; Magnetic films; Magnetic recording; Magnetostatics; Noise reduction; Performance evaluation; Testing; Transistors;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/20.278821
Filename :
278821
Link To Document :
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