Title :
TP-A3 the effects of charge injection on avalanche injected oxide current
Author :
Amantea, R. ; Muller, R.S.
fDate :
11/1/1978 12:00:00 AM
Keywords :
Avalanche breakdown; Character generation; Charge carrier processes; Diodes; Electron traps; Hot carriers; Laboratories; Military computing; Predictive models; Silicon compounds;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1978.19315
