DocumentCode
1061999
Title
TP-A3 the effects of charge injection on avalanche injected oxide current
Author
Amantea, R. ; Muller, R.S.
Volume
25
Issue
11
fYear
1978
fDate
11/1/1978 12:00:00 AM
Firstpage
1349
Lastpage
1349
Keywords
Avalanche breakdown; Character generation; Charge carrier processes; Diodes; Electron traps; Hot carriers; Laboratories; Military computing; Predictive models; Silicon compounds;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1978.19315
Filename
1479709
Link To Document