• DocumentCode
    1062013
  • Title

    Interconnect energy dissipation in high-speed ULSI circuits

  • Author

    Heydari, Payam ; Abbaspour, Soroush ; Pedram, Massoud

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of California, Irvine, CA, USA
  • Volume
    51
  • Issue
    8
  • fYear
    2004
  • Firstpage
    1501
  • Lastpage
    1514
  • Abstract
    This paper presents a detailed empirical study and analytical derivation of voltage waveform and energy dissipation of global lines driven by CMOS drivers. It is shown that at high clock frequencies where the output voltage at the termination point of the transmission line may not reach its steady-state value during the clock period, it is possible to reduce energy dissipation while meeting a dc noise margin by driver sizing. This is in sharp contrast with the steady-state analysis, which states that driver size has no impact on the energy dissipation per output change. In addition, we propose a new design metric which is the product of energy, delay and some measure of ringing in lossy transmission lines. In particular, this paper provides closed-form expressions for the energy dissipation, 50% propagation delay, and the percentage of maximum undershoot when the circuit exhibits an underdamped behavior. This metric is used during the driver sizing problem formulation for minimum energy-delay-ringing product. The experimental results carried out by HSPICE simulation verify the accuracy of our models.
  • Keywords
    CMOS integrated circuits; ULSI; circuit simulation; driver circuits; electromagnetic coupling; high-speed integrated circuits; integrated circuit interconnections; transmission lines; CMOS drivers; HSPICE simulation; clock period; dc noise margin; driver sizing; electromagnetic coupling; global lines; high clock frequencies; high-speed ULSI circuits; interconnect energy dissipation; lossy transmission lines; minimum energy-delay-ringing product; propagation delay; steady-state analysis; steady-state value; termination point; transmission line; underdamped behaviour; voltage waveform; Clocks; Distributed parameter circuits; Driver circuits; Energy dissipation; Frequency; Integrated circuit interconnections; Noise reduction; Steady-state; Ultra large scale integration; Voltage; CMOS driver; electromagnetic coupling; energy dissipation; interconnect; noise margin; transmission line;
  • fLanguage
    English
  • Journal_Title
    Circuits and Systems I: Regular Papers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1549-8328
  • Type

    jour

  • DOI
    10.1109/TCSI.2004.832738
  • Filename
    1323203