• DocumentCode
    1062016
  • Title

    Evolution of the soft error rate model

  • Author

    Hardy, P. ; Malone, D.J.

  • Author_Institution
    IBM Channel Technol., San Jose, CA, USA
  • Volume
    27
  • Issue
    6
  • fYear
    1991
  • fDate
    11/1/1991 12:00:00 AM
  • Firstpage
    5313
  • Lastpage
    5315
  • Abstract
    Soft error rate (SER) models have been used within IBM since the early sixties to determine the capacity capabilities, of diskfiles. Most models consider the data handling capabilities and the mechanical misregistration to determine the TPI for a given system error rate. Recent models have been used to estimate factory yields, field performance distributions, and the effects of manufacturing tolerances. The authors describe the most recent hybrid models which are used for estimating soft error rates on high TPI designs. Particular attention is given to the modified hybrid SER model and the stress model
  • Keywords
    error handling; magnetic disc storage; capacity capabilities; data handling capabilities; diskfiles; high TPI designs; hybrid models; mechanical misregistration; stress model; Data handling; Error analysis; Histograms; Integrated circuit noise; Magnetic heads; Production facilities; Signal to noise ratio; Virtual manufacturing; Writing; Yield estimation;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.278823
  • Filename
    278823