• DocumentCode
    106202
  • Title

    2-D–3-D Switchable Gate Driver Circuit for TFT-LCD Applications

  • Author

    Chih-Lung Lin ; Mao-Hsun Cheng ; Chun-Da Tu ; Chia-Che Hung ; Jhin-Yu Li

  • Author_Institution
    Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan
  • Volume
    61
  • Issue
    6
  • fYear
    2014
  • fDate
    Jun-14
  • Firstpage
    2098
  • Lastpage
    2105
  • Abstract
    This paper presents a novel 2-D-3-D switchable gate driver circuit for active-matrix liquid crystal displays (AMLCDs) applications using the hydrogenated amorphous silicon (a-Si:H) technology. While consisting of 12 thin-film transistors (TFTs), the proposed gate driver circuit includes a pull-up circuit, two alternative circuits, and a key pull-down circuit. To provide a stable output waveform for switching between the 2-D and 3-D modes in AMLCD panel, the proposed circuit can improve the threshold voltage shift of a-Si:H TFT using reversed bias stress. Based on a real circuit integrated on glass with a standard five-mask process applied to a large-sized FHD TFT-LCD panel, the layout area of each gate driver circuit is 359.25 μm × 2296.25 μm. In addition, the power consumption of a 12-stage gate driver circuit is 3.25 and 7.21 mW, while operating at 2-D and 3-D modes, respectively. Measurement results indicate that the output waveform, including output voltage, rising time, and falling time can be stabilized and made almost equal to the initial state after the reliability test at 100 °C over 240 h.
  • Keywords
    amorphous semiconductors; driver circuits; liquid crystal displays; masks; thin film transistors; 2D-3D switchable gate driver circuit; AMLCD applications; FHD TFT-LCD panel; Si:H; TFT-LCD applications; active-matrix liquid crystal displays; five-mask process; hydrogenated amorphous silicon technology; power 3.25 mW; power 7.21 mW; pull-up circuit; reversed bias stress; size 2296.25 mum; size 359.25 mum; temperature 100 degC; thin film transistors; threshold voltage shift; Driver circuits; Logic gates; Power demand; Stress; Switching circuits; Thin film transistors; Threshold voltage; Active-matrix liquid crystal displays (AMLCDs); gate driver circuit; thin-film transistors (TFTs); thin-film transistors (TFTs).;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2014.2319096
  • Filename
    6810190