DocumentCode
1062186
Title
WA-A7 correlation between capacitance deep level measurements and low-frequency noise in InP Schottky diodes
Author
White, Amanda M. ; Grant, Alex J. ; Day, B.
Volume
25
Issue
11
fYear
1978
fDate
11/1/1978 12:00:00 AM
Firstpage
1354
Lastpage
1354
Keywords
Capacitance; Charge carrier processes; Costs; Indium phosphide; Level measurement; Low-frequency noise; Optical noise; Photovoltaic cells; Schottky diodes; Semiconductor device noise;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1978.19333
Filename
1479727
Link To Document