• DocumentCode
    1062202
  • Title

    An Improved Bidirectional SCR Structure for Low-Triggering ESD Protection Applications

  • Author

    Liu, Zhiwei ; Vinson, Jim ; Lou, Lifang ; Liou, Juin J.

  • Author_Institution
    Univ. of Central Florida, Orlando
  • Volume
    29
  • Issue
    4
  • fYear
    2008
  • fDate
    4/1/2008 12:00:00 AM
  • Firstpage
    360
  • Lastpage
    362
  • Abstract
    An improved dual-polarity silicon-controlled rectifier (SCR) device has been proposed and realized in a 0.6-mum bipolar complementary metal-oxide-semiconductor process. The device can be used to protect electrostatic discharge (ESD) in both the positive and negative directions on pins with a voltage range that goes below ground. Comparing with the conventional bidirectional SCR structures, the new device is more suitable for low-voltage integrated circuit ESD protection applications because it possesses a smaller trigger voltage, a smaller leakage current, and a larger holding voltage.
  • Keywords
    CMOS integrated circuits; electrostatic discharge; thyristors; bipolar complementary metal-oxide-semiconductor; dual-polarity silicon-controlled rectifier; electrostatic discharge; Bidirectional electrostatic discharge (ESD) protection; holding voltage; latch-up immunity; triggering voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/LED.2008.917111
  • Filename
    4447677