Title :
An Improved Bidirectional SCR Structure for Low-Triggering ESD Protection Applications
Author :
Liu, Zhiwei ; Vinson, Jim ; Lou, Lifang ; Liou, Juin J.
Author_Institution :
Univ. of Central Florida, Orlando
fDate :
4/1/2008 12:00:00 AM
Abstract :
An improved dual-polarity silicon-controlled rectifier (SCR) device has been proposed and realized in a 0.6-mum bipolar complementary metal-oxide-semiconductor process. The device can be used to protect electrostatic discharge (ESD) in both the positive and negative directions on pins with a voltage range that goes below ground. Comparing with the conventional bidirectional SCR structures, the new device is more suitable for low-voltage integrated circuit ESD protection applications because it possesses a smaller trigger voltage, a smaller leakage current, and a larger holding voltage.
Keywords :
CMOS integrated circuits; electrostatic discharge; thyristors; bipolar complementary metal-oxide-semiconductor; dual-polarity silicon-controlled rectifier; electrostatic discharge; Bidirectional electrostatic discharge (ESD) protection; holding voltage; latch-up immunity; triggering voltage;
Journal_Title :
Electron Device Letters, IEEE
DOI :
10.1109/LED.2008.917111