• DocumentCode
    1062332
  • Title

    Fault Modeling and Detection Capabilities for EFSM Models

  • Author

    Batth, Samrat S. ; Uyar, M. Ümit ; Wang, Yu ; Fecko, Mariusz A.

  • Author_Institution
    City Univ. of New York, New York
  • Volume
    57
  • Issue
    6
  • fYear
    2008
  • fDate
    6/1/2008 12:00:00 AM
  • Firstpage
    1102
  • Lastpage
    1111
  • Abstract
    Inherent timing variables and constraints in communication protocols require new extended finite-state machine (EFSM) models to formally represent their behavior, particularly for test generation purposes. However, infeasible paths due to the conflicts among the timing condition and action variables in the timed EFSM models with the activation and expiration of concurrent timers complicate the test generation process. In a test measurement laboratory, such timers, if not properly taken into account by formal methods at the test generation step, can generate false results by failing correct implementations or, worse, passing faulty implementations. This paper analyzes the fault detection capability of the timed EFSM models introduced in our earlier work in the presence of multiple timing faults. It is proven that, for a class of timing faults, test sequences generated from our models can detect multiple occurrences of pairwise combinations of such faults. A simplified version of the session initiation protocol (SIP) registration process, which is widely used by voice over IP (VoIP) telephones, has been used as a working example throughout this paper.
  • Keywords
    conformance testing; fault diagnosis; finite state machines; protocols; extended finite-state machine; fault detection; fault modeling; session initiation protocol registration process; test sequences; timing faults; voice over IP; Conformance testing; Session Initiation Protocol (SIP); Voice over IP (VoIP); extended finite-state machine (EFSM); fault modeling; finite-state machine (FSM); timed EFSM; timers;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.2007.915145
  • Filename
    4447689