Title :
Light-Enhanced FET Switch Improves ATE RF Power Settling
Author :
Kelly, J. ; Lowery, E. ; Nicholson, D. ; Grothen, V.
Author_Institution :
Verigy Inc., Cupertino
Abstract :
RFIC testing requires cost-effective and innovative hardware implementation. The authors of this article have dramatically improved the speed of RF switches on high-performance ATE by shining a bright light on the switches. This solution provides practical, cost-effective RF testing.
Keywords :
automatic test equipment; field effect transistors; integrated circuit testing; logic design; logic testing; radiofrequency integrated circuits; ATE RF power settling; RFIC testing; automated test equipment; light-enhanced FET switch; radio frequency integrated circuit testing; Attenuators; Automatic logic units; FETs; Gallium arsenide; Radio frequency; Signal design; Signal generators; Surface-mount technology; Switches; System testing; ATE; FET; HVM; RF switch; high-volume manufacturing; power settling; settling time; test time;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.2008.22
