• DocumentCode
    1062606
  • Title

    Time-Division-Multiplexed Test Delivery for NoC Systems

  • Author

    Nolen, John Mark ; Mahapatra, Rabi N.

  • Author_Institution
    Texas A&M Univ., College Station
  • Volume
    25
  • Issue
    1
  • fYear
    2008
  • Firstpage
    44
  • Lastpage
    51
  • Abstract
    This test-scheduling approach for NoC designs minimizes test time through high-speed test delivery over the network, with test data interleaved via time-division multiplexing (TDM), and through slower test execution at the target cores. Results with a test-scheduling algorithm and a simulated test case from ITC 2002 SoC benchmarks show significant test time and I/O savings compared to a single-clock approach.
  • Keywords
    logic design; logic testing; network-on-chip; scheduling; time division multiplexing; I/O saving; ITC 2002 SoC benchmark; NoC system design; single-clock approach; test-scheduling approach; time-division-multiplexed test delivery; Bandwidth; Circuit testing; Design engineering; Large-scale systems; Network-on-a-chip; Parallel processing; Reliability engineering; Semiconductor device testing; System testing; Time to market; NoC; SoC; TAM; TDM; embedded-core testing; scan test delivery; test access mechanism; time-division multiplexing;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/MDT.2008.27
  • Filename
    4447909
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1062606