DocumentCode :
1062688
Title :
Reliability of hybrid encapsulation based on fluorinated polymeric materials
Author :
Christou, A. ; Griffith, James R. ; Wilkins, B.R.
Author_Institution :
Naval Research Laboratory, Washington, DC
Volume :
26
Issue :
1
fYear :
1979
fDate :
1/1/1979 12:00:00 AM
Firstpage :
77
Lastpage :
83
Abstract :
A new class of polymeric materials [1] synthesized from fluorinated precursors to produce network molecules of epoxies and polyurethanes has been analyzed as a hybrid encapsulation material. Using test structures, a microthin film (Au-Al2O3) moisture sensor and Auger/SIMS analysis, the moisture penetration kinetics for the fluorinated network polymeric materials (FNP) has been determined. It was determined that the activation energy for moisture penetration varied from 0.7 to 1.1 eV at relative humidity (RH) between 20-95 percent. Interdigitated test structures were utilized in order to study the migrative resistive short (MGRS) phenomenon in the hybrids encapsulated with the FNP material. The results show that for a surface ionic contamination level of 1014Na+/cm2on the encapsulant surface, RH of 95 percent and temperature cycle of +100 to -10°C migrative resistance shorts were not observed after 100 cycles of total duration of 4 h per cycle.
Keywords :
Encapsulation; Humidity; Kinetic theory; Materials reliability; Materials testing; Moisture; Network synthesis; Polymer films; Surface contamination; Surface resistance;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1979.19382
Filename :
1479960
Link To Document :
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