DocumentCode :
1062701
Title :
CEDA Currents
Volume :
25
Issue :
1
fYear :
2008
Firstpage :
100
Lastpage :
101
Abstract :
This newsletter covers news, research, and events related to the IEEE Council on Electronic Design Automation.
Keywords :
Automatic testing; Conferences; Design automation; Design optimization; Electronic equipment testing; Europe; Joining IEEE; Network-on-a-chip; Timing; Very large scale integration; CEDA; DATE; EDA research; NoCS; PATMOS; SRC GRC; VLSI-SOC; industry growth;
fLanguage :
English
Journal_Title :
Design & Test of Computers, IEEE
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/MDT.2008.4
Filename :
4447918
Link To Document :
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