Abstract :
This newsletter covers news, research, and events related to the IEEE Council on Electronic Design Automation.
Keywords :
Automatic testing; Conferences; Design automation; Design optimization; Electronic equipment testing; Europe; Joining IEEE; Network-on-a-chip; Timing; Very large scale integration; CEDA; DATE; EDA research; NoCS; PATMOS; SRC GRC; VLSI-SOC; industry growth;
Journal_Title :
Design & Test of Computers, IEEE
