Title :
Selecting Test Frequencies for Two-Tone Phase-Plane Analysis of ADCs: Part II
Author :
Blair, Jerome J.
Author_Institution :
Nat. Security Technol., Las Vegas
Abstract :
A method for selecting test frequencies for two-tone phase-plane modeling of ADCs is given. The results here include and generalize the results of a previous paper on the subject. The new results show how to select a good frequency pair that is near any two specified frequencies. An error analysis is given showing how close the actual test frequencies must be to their ideal values to maintain near-optimal phase-plane coverage.
Keywords :
analogue-digital conversion; circuit testing; ADC; analog-to-digital converter; near-optimal phase-plane coverage; test frequencies; two-tone phase-plane analysis; Analog-digital conversion; Character recognition; Circuit testing; Error analysis; Frequency; National security; Phase distortion; Sampling methods; Signal analysis; Signal generators; Analog-to-digital converter (ADC) testing; distortion compensation; phase plane; two-tone tests;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.2007.899910
